Content
ACTIVE LAYER PARAMETRICS(ALP)
[CA , USA]
Features
ALPro™ technology has the capability to provide complete electrical characterization of semiconductor layers at atomic-scale depth resolution,
rapidly and economically, to enable efficient process development, modeling and reliable manufacturing control.
Website
Active Layer Parametrics, Inc. – Electrical Characterization of Ultrathin Layers (alpinc.net)
Products
ALPro™50 & ALPro™100 Profilers
Application
Electrical parameter depth profiles
- NextCDE 23.08.02